| 000 | 00650nam a2200205Ia 4500 | ||
|---|---|---|---|
| 008 | 220204s9999 xx 000 0 und d | ||
| 082 |
_a620(031) _bBRU |
||
| 100 | _aBrundle, C R | ||
| 245 | 0 | _aEncyclopedia of materials characterization : Surfaces, interfaces, thinfilms | |
| 260 |
_aBoston _bButterworth-Heinemann _c1992 |
||
| 650 | _aElectron beam instruments | ||
| 650 | _aElectron emission spectroscopy | ||
| 650 | _airon scatterin techniques | ||
| 650 | _aMagnetic properties | ||
| 650 | _aMicroscopy | ||
| 650 | _aneutron and nuclear techniques | ||
| 650 | _aVisible/UV emission | ||
| 650 | _aX-ray emission techniques | ||
| 942 | _cBK | ||
| 999 |
_c40966 _d40966 |
||