000 00356nam a2200121Ia 4500
008 220204s9999 xx 000 0 und d
082 _a519.2
_bBAI
100 _aLee J
245 0 _aStatistical analysis of reliability and life testing models
260 _aNew York
_bMarcel Dekker
_c1978
490 _aStatistics: Textbooks and monographs V 24
942 _cBK
999 _c31398
_d31398