TY  - BOOK
AU  - Jeon I H
AU  - Kim H
AU  - Kim S G
TI  - Characterization of rubber micro-morphology by atomic force microscopy(AFM)
PY  - 2003///
PB  - Rubber Chemistry and Technology
KW  - Micro-morphology
KW  - Rubber blend compounds
KW  - Tapping Mode Atomic Force Microscopy
KW  - Transmission Electron Microscopy
ER  -